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C8051F507

C8051F507  50 MIPS, 32 kB Flash, 12-Bit ADC, 32-Pin Automotive MCU

C8051F507  Analog Peripherals

12-Bit ADC, 5 V input signal; up to 25 external inputs
- ±1 LSB INL; guaranteed monotonic
- Programmable throughput up to 200 ksps
- Data-dependent windowed interrupt generator
- Programmable gain maximizes input signal span
Built-in Temperature Sensor (±3 °C)
Two Comparators
Precision Internal Voltage Reference
VDD Monitor/Brown-out Detector
On-Chip Debug
- On-chip debug circuitry facilitates full speed, non-intrusive in-system
debug (no emulator required)
- Provides breakpoints, single stepping, watch-points
- Inspect/modify memory, registers, and stack
- Superior performance to emulation systems using ICE-chips, target
pods, and sockets
Temperature Range: –40 to +125 °C
Operating Voltage: 1.8 to 5.25 V
- Multiple power saving sleep and shutdown modes
Development Kit: C8051F500DK
High-Speed 8051 μC Core
- Pipelined instruction architecture; executes 70% of instructions in one or
two system clocks
- Up to 50 MIPS throughput
Memory
- 32 kB Flash; in-system programmable; flexible security features
- 4352 bytes data RAM (256 + 4 kB)
Digital Peripherals
- Up to 25 digital I/O; all are 5 V push-pull
- Hardware I2C, SPI™, and UART serial ports available concurrently
- Programmable 16-bit counter array with six capture/compare modules
- Four general-purpose 16-bit counter/timers
Clock Sources
- Internal programmable ±0.5% oscillator: up to 50 MHz
- External oscillator: Crystal, RC, C, or CMOS Clock
Ordering Part Numbers
-C8051F507-IM, 32-Pin QFN (RoHS-compliant), 5 x 5 mm2
-C8051F507-IQ, 32-Pin QFP (RoHS-compliant), 9 x 9 mm2